FISCHERSCOPE® X-RAY XDLM
SKU:
$12,654.00
$12,654.00
X-ray fluorescence (XRF) measuring instrument for manual or automated coating thickness measurements and analyses on pc-boards, electronics components and mass-produced parts, even on small components
Features
Very universal because equipped with a micro-focus tube, 4-x aperture changer and 3 primary filters
Suitable for smaller structures such as connector contacts or printed circuit boards
Larger measuring distances are possible as well (DCM, stroke 0-80 mm)
Large and spacious measurement chamber with a cutout
(C-slot)
A programmable stage for automated measurements is available
Typical fields of application
Measurement of e.g. thin gold, palladium and nickel coatings in the PC Board industry
Measurement of coated connectors and contacts
Measurement of functional coatings in the electronics and semiconductor industries
Gold, jewellery and watch industries
Features
Very universal because equipped with a micro-focus tube, 4-x aperture changer and 3 primary filters
Suitable for smaller structures such as connector contacts or printed circuit boards
Larger measuring distances are possible as well (DCM, stroke 0-80 mm)
Large and spacious measurement chamber with a cutout
(C-slot)
A programmable stage for automated measurements is available
Typical fields of application
Measurement of e.g. thin gold, palladium and nickel coatings in the PC Board industry
Measurement of coated connectors and contacts
Measurement of functional coatings in the electronics and semiconductor industries
Gold, jewellery and watch industries
