FISCHERSCOPE X-Ray XUV® 773
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The XUV® 773 is designed for thin layer measurement and analysis in general. Therefore it is dedicated for research, quality control and optimization of production processes. Typical applications are:
Thin coatings like CIGS, CIS, CdTe
Coatings and analysis in electronic and semiconductor industries
Gold, jewelry and gem stone analysis, without alteration of the sample
Analysis of traces, RoHS, WEEE
Thin coatings like CIGS, CIS, CdTe
Coatings and analysis in electronic and semiconductor industries
Gold, jewelry and gem stone analysis, without alteration of the sample
Analysis of traces, RoHS, WEEE
