FISCHERSCOPE X-RAY XUL
Description:
The FISCHERSCOPE XUL, is designed with the X-Ray tube and the detector system located underneath the measuring stage. This results in a bottom to top measurement direction. It offers significant advantages, especially for measuring small components with varying geometry such as screws, nuts, bolts, or various types of electrical contacts. In most cases, the surface area to be tested can be placed directly on the measuring stage. This avoids the adjustment of the measurement distance otherwise required with top to bottom measurement systems. The measurement spot is automatically at the correct distance. This speeds up the measurement process and avoids possible measurement errors as a result of a poor part positioning. - FISCHER is the only manufacturer of X-Ray fluorescence coating thickness measuring instruments to incorporate this practical design.
In combination with the software WinFTM V.6 and the application kit Gold Assay, the XUL is also part of the FISCHERSCOPE® GOLDLINE ASSAY, ideally suited for the fast, non-destructive and accurate gold content measurement in jewelry and precious metals.
The FISCHERSCOPE XUL, is designed with the X-Ray tube and the detector system located underneath the measuring stage. This results in a bottom to top measurement direction. It offers significant advantages, especially for measuring small components with varying geometry such as screws, nuts, bolts, or various types of electrical contacts. In most cases, the surface area to be tested can be placed directly on the measuring stage. This avoids the adjustment of the measurement distance otherwise required with top to bottom measurement systems. The measurement spot is automatically at the correct distance. This speeds up the measurement process and avoids possible measurement errors as a result of a poor part positioning. - FISCHER is the only manufacturer of X-Ray fluorescence coating thickness measuring instruments to incorporate this practical design.
In combination with the software WinFTM V.6 and the application kit Gold Assay, the XUL is also part of the FISCHERSCOPE® GOLDLINE ASSAY, ideally suited for the fast, non-destructive and accurate gold content measurement in jewelry and precious metals.
FISCHERSCOPE X-RAY XDL
Description:
The FISCHERSCOPE X-RAY XDL instruments are universally applicable energy dispersive x-ray spectrometers. They represent the next step in the development of the proven FISCHERSCOPE X-RAY XDL-B model series. Like their predecessors, they are particularly well suited for non-destructive thickness measurements and analysis of thin coatings, for measurements on mass-produced parts and pc-boards as well as for the solution analysis.
A high count rate is achieved by using a proportional counter tube, which allows for precise measurements. Using the Fischer fundamental parameter method, coating systems as well as solid and liquid samples can be analyzed standard-free. It is possible to detect up to 24 elements in the range from chlorine (17) to uranium (92) simultaneously.
The XDL x-ray spectrometers have an excellent long-term stability, which among other things is reflected in a significantly reduced calibration effort. The instruments of the XDL® series are especially well suited for measurements in quality assurance, reception inspection and production monitoring.
Typical areas of application are:
Measurement of electro-plated mass-produced parts
Inspection of thin coatings, e.g., decorative chromium-plating
Analysis of functional coatings in the electronics and semiconductor industries
Automated measurements, e.g., on pc-boards
Solution analysis in the electroplating
The FISCHERSCOPE X-RAY XDL instruments are universally applicable energy dispersive x-ray spectrometers. They represent the next step in the development of the proven FISCHERSCOPE X-RAY XDL-B model series. Like their predecessors, they are particularly well suited for non-destructive thickness measurements and analysis of thin coatings, for measurements on mass-produced parts and pc-boards as well as for the solution analysis.
A high count rate is achieved by using a proportional counter tube, which allows for precise measurements. Using the Fischer fundamental parameter method, coating systems as well as solid and liquid samples can be analyzed standard-free. It is possible to detect up to 24 elements in the range from chlorine (17) to uranium (92) simultaneously.
The XDL x-ray spectrometers have an excellent long-term stability, which among other things is reflected in a significantly reduced calibration effort. The instruments of the XDL® series are especially well suited for measurements in quality assurance, reception inspection and production monitoring.
Typical areas of application are:
Measurement of electro-plated mass-produced parts
Inspection of thin coatings, e.g., decorative chromium-plating
Analysis of functional coatings in the electronics and semiconductor industries
Automated measurements, e.g., on pc-boards
Solution analysis in the electroplating
FISCHERSCOPE X-RAY XDAL
Description:
The XDAL instruments with silicon PIN detectors provide reliable analysis results and coating thickness readings even with small concentrations and very thin coatings. With their fast and highly precise XY(Z) measuring stage, they are ideally suited for automated sample measurements.
Typical areas of application are:
Analysis of very thin coatings, e.g. gold and palladium coatings of = 0.1 µm
Measurement of functional coatings in the electronics and semiconductor industries
Determination of complex multi-coating systems
Automated measurements, e.g. in quality control
Determination of the lead content in solder
The XDAL instruments with silicon PIN detectors provide reliable analysis results and coating thickness readings even with small concentrations and very thin coatings. With their fast and highly precise XY(Z) measuring stage, they are ideally suited for automated sample measurements.
Typical areas of application are:
Analysis of very thin coatings, e.g. gold and palladium coatings of = 0.1 µm
Measurement of functional coatings in the electronics and semiconductor industries
Determination of complex multi-coating systems
Automated measurements, e.g. in quality control
Determination of the lead content in solder
FISCHERSCOPE X-RAY 5000
The FISCHERSCOPE X-RAY 5000 instruments are innovative energy dispersive x-ray fluorescence spectrometers (EDXRF) for in-line applications in industrial production sites. They fulfill DIN ISO 3497 and ASTM B 568.
These instruments are specially designed for continuous non-destructive analysis and measurement of thin layers and layer systems in production processes. For industrial demands and maintenance free continuous operation, the design is robust and without any moving parts.
The FISCHERSCOPE X-RAY 5000 measures and analyzes layers and layer systems
- in the photo voltaic industry, i.e. CIGS, CIS, CdTe
- foils and belts
- alloys and coatings
- under ambient temperature or on very hot surfaces (up to 500°C / 932 F)
- in continuous operation and under industrial conditions
The FISCHERSCOPE X-RAY 5000 measures in a vacuum or ambient air. With its powerful semiconductor detectors, it can determine elements in the range of sodium to uranium.
For easy integration into production lines they come with a standardized mounting flange. Various modular build versions are available.
These instruments are specially designed for continuous non-destructive analysis and measurement of thin layers and layer systems in production processes. For industrial demands and maintenance free continuous operation, the design is robust and without any moving parts.
The FISCHERSCOPE X-RAY 5000 measures and analyzes layers and layer systems
- in the photo voltaic industry, i.e. CIGS, CIS, CdTe
- foils and belts
- alloys and coatings
- under ambient temperature or on very hot surfaces (up to 500°C / 932 F)
- in continuous operation and under industrial conditions
The FISCHERSCOPE X-RAY 5000 measures in a vacuum or ambient air. With its powerful semiconductor detectors, it can determine elements in the range of sodium to uranium.
For easy integration into production lines they come with a standardized mounting flange. Various modular build versions are available.
FISCHERSCOPE X-RAY XDV SDD
The FISCHERSCOPE-X-RAY XDV®-SDD is a universally applicable energy dispersive x-ray spectrometer. It is particularly well suited for the non-destructive analysis of very thin coatings, for small concentrations trace analysis and for automated measurements.
Typical areas of application are:
- Analysis of thin or very thin coatings,e.g., gold/palladium coatings of =0.1 µm
- Trace analysis on pc boards according to RoHS and WEEE requirements
- Gold and precious metals analysis
- Measurement of functional coatings in the electronics and semiconductor industries
- Determination of complex multi-coating systems
- Automated measurements, e.g., in quality control
To create ideal excitation conditions for every measurement, the XDV-SDD features electrically changeable apertures and primary filters. The modern silicon drift detector achieves high analysis accuracy and good detection sensitivity. Due to large apertures (collimators) and a very fast pulse processor, it is ideally suited for capturing high count rates.
The XDV-SDD x-ray spectrometer has an excellent long-term stability, which is reflected in a significantly reduced calibration effort, among other things. Using the fundamental parameter method, coating systems as well as solid and liquid samples can be analyzed standard-free. It is possible to detect up to 24 elements in a range from aluminum (13) to uranium (92) simultaneously.
With its fast, programmable X/Y-stage, it is the fitting measuring instrument for automated sample measurements.
Typical areas of application are:
- Analysis of thin or very thin coatings,e.g., gold/palladium coatings of =0.1 µm
- Trace analysis on pc boards according to RoHS and WEEE requirements
- Gold and precious metals analysis
- Measurement of functional coatings in the electronics and semiconductor industries
- Determination of complex multi-coating systems
- Automated measurements, e.g., in quality control
To create ideal excitation conditions for every measurement, the XDV-SDD features electrically changeable apertures and primary filters. The modern silicon drift detector achieves high analysis accuracy and good detection sensitivity. Due to large apertures (collimators) and a very fast pulse processor, it is ideally suited for capturing high count rates.
The XDV-SDD x-ray spectrometer has an excellent long-term stability, which is reflected in a significantly reduced calibration effort, among other things. Using the fundamental parameter method, coating systems as well as solid and liquid samples can be analyzed standard-free. It is possible to detect up to 24 elements in a range from aluminum (13) to uranium (92) simultaneously.
With its fast, programmable X/Y-stage, it is the fitting measuring instrument for automated sample measurements.
FISCHERSCOPE X-Ray XAN 120
FISCHERSCOPE X-Ray XAN 120 is a modern tabletop x-ray spectrometer (EDXRF). It is optimized for fast, non-destructive analysis of jewelry, precious metals in general, yellow and white gold, platinum and silver, rhodium, coins and all jewelry alloys and coatings.
The XAN® 120 is accurate, safe and easy to use, robust and maintenance free. In addition, it meets the requirements of DIN ISO 3497 and ASTM B 568. The high-resolution silicon-PIN-detector combined with a fast signal processing achieves extreme precision and very low detection limits. In a matter of seconds, all elements in the range of Chlorine (17) to Uranium (92) are determined accurately.
Whether you want to measure known samples or determine unknown materials, the XAN® 120 with the exceptional Fischer WinFTM® operating software is the right choice.
Either using the new and improved fundamental parameter standardless method or standards based – the result is always fast and exact. To simplify sample placement, the x-ray source and the high resolution silicon-PIN-detector are arranged in the base of the XAN® 120 which uses an upwards measurement technique.
The integrated video-microscope with cross hair, beam indicator, spot illumination and magnification make sample placement and spot determination quick and easy. There is no need to adjust a table or sample stage – just place and measure.
Long-term stability and outstanding precision – better than 1‰ for gold – are benefits of the XAN® 120. In addition, the necessity for re-calibration is significantly reduced thus saving time, effort and cost of ownership. Measured results are displayed in karat, ‰ or weight %, and easily printed out as customized reports.
Excellent ergonomics, easy operation and fast calculation of the measurement best describe the XAN® 120 . Usage is safe and easy – for experienced staff as well as for employees with little training. There is no need for a special laboratory room for the XAN® 120. If you need an outstanding, accurate and reliable tool– the XAN® 120 is the right choice.
WinFTM Evaluation Software for PC
The advanced Fischer WinFTM software comes all inclusive – complete, easy to use and without any need for additional modules or upgrades. It includes:
Operation of the x-ray unit
Control of the entire measuring process
Advanced fundamental parameter method for standard- free measurements
Standard based measurements, calibration with certified standards
Material analysis of composition and coating thickness
Automatic element peak identification
Indication of values as karat, wt% or ‰
Reporting tool for customized reports
The XAN® 120 is accurate, safe and easy to use, robust and maintenance free. In addition, it meets the requirements of DIN ISO 3497 and ASTM B 568. The high-resolution silicon-PIN-detector combined with a fast signal processing achieves extreme precision and very low detection limits. In a matter of seconds, all elements in the range of Chlorine (17) to Uranium (92) are determined accurately.
Whether you want to measure known samples or determine unknown materials, the XAN® 120 with the exceptional Fischer WinFTM® operating software is the right choice.
Either using the new and improved fundamental parameter standardless method or standards based – the result is always fast and exact. To simplify sample placement, the x-ray source and the high resolution silicon-PIN-detector are arranged in the base of the XAN® 120 which uses an upwards measurement technique.
The integrated video-microscope with cross hair, beam indicator, spot illumination and magnification make sample placement and spot determination quick and easy. There is no need to adjust a table or sample stage – just place and measure.
Long-term stability and outstanding precision – better than 1‰ for gold – are benefits of the XAN® 120. In addition, the necessity for re-calibration is significantly reduced thus saving time, effort and cost of ownership. Measured results are displayed in karat, ‰ or weight %, and easily printed out as customized reports.
Excellent ergonomics, easy operation and fast calculation of the measurement best describe the XAN® 120 . Usage is safe and easy – for experienced staff as well as for employees with little training. There is no need for a special laboratory room for the XAN® 120. If you need an outstanding, accurate and reliable tool– the XAN® 120 is the right choice.
WinFTM Evaluation Software for PC
The advanced Fischer WinFTM software comes all inclusive – complete, easy to use and without any need for additional modules or upgrades. It includes:
Operation of the x-ray unit
Control of the entire measuring process
Advanced fundamental parameter method for standard- free measurements
Standard based measurements, calibration with certified standards
Material analysis of composition and coating thickness
Automatic element peak identification
Indication of values as karat, wt% or ‰
Reporting tool for customized reports
SIGMASCOPE SMP10
-The SIGMASCOPE SMP10 is a hand-held instrument which provides rapid, simple, on-the-spot and, if necessary contact free, measurement of the conductivity of non-magnetic metals.
-The corresponding measurement probe ES40 operates at the measurement frequencies of 60 kHz, 120 kHz, 240 kHz and 480 kHz.
-For automatic temperature compensation of the conductivity measurement the current temperature of the specimen can be measured using either the temperature sensor integrated in the probe ES40 or an optional external sensor.
-For the conductivity measurements of very thin Aluminum platings of only about 0.2 mm thickness in the aircraft industry the SIGMASCOPE® SMP10-HF is available. The measurement frequencies are 60 kHz, 240 kHz and 480 kHz with probe ES40 and 1.25 MHz with probe ES40-HF.
Applications:
-Absolute measurement of electrical conductivity during the production process of aluminum copper, etc.
-Monitoring heat-treatment processes, strength and hardness of aluminum wrought alloys in the aerospace and automobile industries.
-Checking the electrical conductivity before anodizing aluminum.
-Determination of the degree of purity and scrap metal sorting.
-The corresponding measurement probe ES40 operates at the measurement frequencies of 60 kHz, 120 kHz, 240 kHz and 480 kHz.
-For automatic temperature compensation of the conductivity measurement the current temperature of the specimen can be measured using either the temperature sensor integrated in the probe ES40 or an optional external sensor.
-For the conductivity measurements of very thin Aluminum platings of only about 0.2 mm thickness in the aircraft industry the SIGMASCOPE® SMP10-HF is available. The measurement frequencies are 60 kHz, 240 kHz and 480 kHz with probe ES40 and 1.25 MHz with probe ES40-HF.
Applications:
-Absolute measurement of electrical conductivity during the production process of aluminum copper, etc.
-Monitoring heat-treatment processes, strength and hardness of aluminum wrought alloys in the aerospace and automobile industries.
-Checking the electrical conductivity before anodizing aluminum.
-Determination of the degree of purity and scrap metal sorting.
ANOTEST YMP30 S
The ANOTEST YMP 30-S tests the sealing quality of anodic coatings on aluminum, which is an important factor for weather resistance.
It measures the admittance Y of the anodic oxide film in accordance to DIN EN 12 373-5 and ASTM B 457-67.
In addition to measuring film thickness, the sealing quality of the coating should be measured. The purpose of measuring the sealing quality is to determine the weather resistance of a finish. The Anotest® is used for measurements on decorative anodic finishes, anodic finishes used in the construction industry and super hard anodic finishes.
The measurement procedure includes a self adhesive rubber ring which is placed on the surface to be tested with a few drops of test fluid. The aluminum surface is then connected to the socket of the unit and the test electrode dipped into the cell fluid. This in turn forms a capacitor in which the anodic film acts as the dielectric. It is the admittance of this capacitor that is measured and directly indicated in microsiemens.
It measures the admittance Y of the anodic oxide film in accordance to DIN EN 12 373-5 and ASTM B 457-67.
In addition to measuring film thickness, the sealing quality of the coating should be measured. The purpose of measuring the sealing quality is to determine the weather resistance of a finish. The Anotest® is used for measurements on decorative anodic finishes, anodic finishes used in the construction industry and super hard anodic finishes.
The measurement procedure includes a self adhesive rubber ring which is placed on the surface to be tested with a few drops of test fluid. The aluminum surface is then connected to the socket of the unit and the test electrode dipped into the cell fluid. This in turn forms a capacitor in which the anodic film acts as the dielectric. It is the admittance of this capacitor that is measured and directly indicated in microsiemens.
Fisher FMP100
The DUALSCOPE FMP100 is the most advanced in the FMP-family. A measurement computer which offers an extremely user-friendly operation, a high resolution color touch screen and a Windows CE operating system. The DUALSCOPE FMP100 is a universal solution, using magnetic induction and the eddy current methods.
The FMP100 is ideal for different measurement applications because settings and calibrations can be stored and recalled right on the display.
In addition to extensive evaluation and statistics functions, the FMP100 offers flexible graphical presentations of the measurement data. An Innovative tool for quality control, the FDD-software (Factory Diagnosis Diagram) is integrated.
For various measurement applications in the field of coating thickness a broad range of probes is available. A robust connector with build in intelligence makes it quick and easy to change a probe.
The FMP100 is ideal for different measurement applications because settings and calibrations can be stored and recalled right on the display.
In addition to extensive evaluation and statistics functions, the FMP100 offers flexible graphical presentations of the measurement data. An Innovative tool for quality control, the FDD-software (Factory Diagnosis Diagram) is integrated.
For various measurement applications in the field of coating thickness a broad range of probes is available. A robust connector with build in intelligence makes it quick and easy to change a probe.
Fisher FMP10 FMP20 FMP30 FMP40
DELTASCOPE FMP10 and FMP30 - ISOSCOPE FM10 and FMP30 - DUALSCOPE FMP20 and FMP30
The FMP hand-held instruments measure coating thicknesses non-distructively with high precision. Magnetic induction (DELTASCOPE), eddy current (ISOSCOPE) or both methods (DUALSCOPE). They are modern, robust and user-friendly an can be adapted to any measuring application using interchangeable probes.
FMP10 and FMP20 are entry level models for professional evaluation of coatings, ideal for repetitive measuring applications.
FMP30 and FMP40 feature additional strategies for measurement capture, more memory and extensive graphical and statistical evaluation capabilities.
Special measurement functions are incorporated and easyly to accessible by menue, to measure according established industrial recommendations like IMO PSPC, SSPC-PA2, QUALANOD und QUALICOAT.
These instruments are optionally with an integrated Bluetooth interface available, for data transmission to a pc or notebook.
With their USB interface all FMP instruments support data communication to PC. The FMP30 and FMP40 are able to send a measuring report directly to a USB-printer.
The FMP hand-held instruments measure coating thicknesses non-distructively with high precision. Magnetic induction (DELTASCOPE), eddy current (ISOSCOPE) or both methods (DUALSCOPE). They are modern, robust and user-friendly an can be adapted to any measuring application using interchangeable probes.
FMP10 and FMP20 are entry level models for professional evaluation of coatings, ideal for repetitive measuring applications.
FMP30 and FMP40 feature additional strategies for measurement capture, more memory and extensive graphical and statistical evaluation capabilities.
Special measurement functions are incorporated and easyly to accessible by menue, to measure according established industrial recommendations like IMO PSPC, SSPC-PA2, QUALANOD und QUALICOAT.
These instruments are optionally with an integrated Bluetooth interface available, for data transmission to a pc or notebook.
With their USB interface all FMP instruments support data communication to PC. The FMP30 and FMP40 are able to send a measuring report directly to a USB-printer.
Fisher MP0, MP0R, MP0R-FP
DUALSCOPE and ISOSCOPE MP0/MP0R series
Robust, handy and small - the MP0/MP0R-series. For mobile, precise and non-destructive coating thickness measurements using magnetic inductive or eddy current method.
The professional measurement technology from FISCHER in a compact design. With two rectangular placed displays and bright illumination for an outstanding readability. Perfect suited for quick reliable and precise measurements – also under difficult conditions like hardly accessible areas or bad illumination.
In various versions available:
DUALSCOPE MP0: For measurement of coatings on ferrous or non-ferrous materials.
DUALSCOPE MP0R: With additional radio- and USB-interface for data transmission to a PC
DUALSCOPE MP0R-FP: With fixed cable probe, radio- and USB interface
ISOSCOPE MP0R: For measurements only on non-ferrous materials. With radio- and USB interface.
Robust, handy and small - the MP0/MP0R-series. For mobile, precise and non-destructive coating thickness measurements using magnetic inductive or eddy current method.
The professional measurement technology from FISCHER in a compact design. With two rectangular placed displays and bright illumination for an outstanding readability. Perfect suited for quick reliable and precise measurements – also under difficult conditions like hardly accessible areas or bad illumination.
In various versions available:
DUALSCOPE MP0: For measurement of coatings on ferrous or non-ferrous materials.
DUALSCOPE MP0R: With additional radio- and USB-interface for data transmission to a PC
DUALSCOPE MP0R-FP: With fixed cable probe, radio- and USB interface
ISOSCOPE MP0R: For measurements only on non-ferrous materials. With radio- and USB interface.
Fisher COULOSCOPE CMS
COULOSCOPE CMS (Coulometric Measuring System) uses the coulometric method for measuring coating thickness. New design features include a large, easy to read LCD display, an intuitive menu-driven operator system, the new V18 measuring stand that allows automatic filling and emptying of the cell by pump control as well as additional SPC capabilities.
The instrument is ideal for measuring the thickness of virtually any metallic coating on a metallic or non-metallic substrate, including multiple coatings. It is used in applications where non-destructive methods cannot or need not be used.
The COULOSCOPE CMS, accurately measures metallic coatings in the range of 0.05 - 40 µm. The unit is capable of storing hundreds of predefined coating/substrate applications from single coatings such as zinc on steel up to triple coatings like chromium on nickel on copper on plastic. Multiple storage memories allow thousands of measurement values to be recorded and saved.
An RS232 interface allows the stored data to be printed or downloaded to a PC.
The instrument is ideal for measuring the thickness of virtually any metallic coating on a metallic or non-metallic substrate, including multiple coatings. It is used in applications where non-destructive methods cannot or need not be used.
The COULOSCOPE CMS, accurately measures metallic coatings in the range of 0.05 - 40 µm. The unit is capable of storing hundreds of predefined coating/substrate applications from single coatings such as zinc on steel up to triple coatings like chromium on nickel on copper on plastic. Multiple storage memories allow thousands of measurement values to be recorded and saved.
An RS232 interface allows the stored data to be printed or downloaded to a PC.
Fisher PHASCOPE PMP10 DUPLEX
Whenever a one-step-thickness-measurement of individual layers of a lacquer on zinc on iron coating or of a lacquer on aluminum coating is required, the PHASCOPE® PMP10 DUPLEX is the right instrument, That makes the PMP10 DUPLEX the ideal instrument for the modern automotive industry where body parts out of zinc plated steel and aluminum are mixed.
The PHASCOPE® PMP10 DUPLEX has three principles for coating thickness measurement ideally combined; the phase-sensitive eddy current method, the amplitude-sensitive eddy current principle and the magneto-inductive method.
Using the phase-sensitive method the thickness of a zinc coating on iron can be determined regardless the thickness of a covering lacquer coating. In addition the entire thickness of lacquer and zinc coating is measured using the magneto-inductive method. That makes it easy to determine the whole composition and individual thicknesses.
Due to the phase-sensitive eddy current method the PMP10 DUPLEX is capable to measure under a lacquer coating very precisely the zinc coating with a thickness between 0µm and about 100µm. That makes it superior to conventional eddy current thickness gauges, without the need of a special phase adjustment or the need for an increased measurement frequency to compensate thickness variations of the zinc layer.
Typical applications are all applications where DUPLEX coatings are used:
the automotive industry, car body painting, brake line tubes, etc.
The PHASCOPE® PMP10 DUPLEX has three principles for coating thickness measurement ideally combined; the phase-sensitive eddy current method, the amplitude-sensitive eddy current principle and the magneto-inductive method.
Using the phase-sensitive method the thickness of a zinc coating on iron can be determined regardless the thickness of a covering lacquer coating. In addition the entire thickness of lacquer and zinc coating is measured using the magneto-inductive method. That makes it easy to determine the whole composition and individual thicknesses.
Due to the phase-sensitive eddy current method the PMP10 DUPLEX is capable to measure under a lacquer coating very precisely the zinc coating with a thickness between 0µm and about 100µm. That makes it superior to conventional eddy current thickness gauges, without the need of a special phase adjustment or the need for an increased measurement frequency to compensate thickness variations of the zinc layer.
Typical applications are all applications where DUPLEX coatings are used:
the automotive industry, car body painting, brake line tubes, etc.
FERITSCOPE® FMP30
The rugged FERITSCOPE® FMP30 with plug-in type smart probe is suited for fast, non-destructive and accurate measurement of ferrite content on-site or in the lab according to the magnetic inductive method.
The measurement range is from 0.1 to 80 % Fe or from 0.1 to 110 FN. The measurement options are either measurable in Ferrit-percentage “%Fe” or in Ferrit numbers “FN”.
Applications are all measurements of the ferrite content in
-austenitic steel welds e.g. of tubing etc.
-normal construction steel with austenitic chrome alloy steel welded cladding e.g., in boilers, vessels, etc.
-duplex steel.
This easy-to-use instrument has an USB interface for a PC and printer connection. A Bluetooth interface is optionally available. It offers memory for up to 20.000 measurements with up to 100 applications. Further a detailed statistical and graphical evaluation is possible.
The calibration of the FERITSCOPE® FMP30 is traceable to internationally approved IIW secondary calibration standards. The instrument therefore meets all requirements of ANSI/AWS A4.2 and DIN EN ISO 8249 as well as of the "Basler" standard.
The measurement range is from 0.1 to 80 % Fe or from 0.1 to 110 FN. The measurement options are either measurable in Ferrit-percentage “%Fe” or in Ferrit numbers “FN”.
Applications are all measurements of the ferrite content in
-austenitic steel welds e.g. of tubing etc.
-normal construction steel with austenitic chrome alloy steel welded cladding e.g., in boilers, vessels, etc.
-duplex steel.
This easy-to-use instrument has an USB interface for a PC and printer connection. A Bluetooth interface is optionally available. It offers memory for up to 20.000 measurements with up to 100 applications. Further a detailed statistical and graphical evaluation is possible.
The calibration of the FERITSCOPE® FMP30 is traceable to internationally approved IIW secondary calibration standards. The instrument therefore meets all requirements of ANSI/AWS A4.2 and DIN EN ISO 8249 as well as of the "Basler" standard.
FISCHERSCOPE® X-RAY XDVM u (SD)
The FISCHERSCOPE® X-RAY XDVM µ (SD) is used for the analysis of coating systems on microstructures. Due to its novel, patented mirror X-ray optics, this instrument can generate very small measurement spots of only about 20 µm x 50 µm in size with very high radiation intensities.
Contrary to the purely µ-design version, the XDVM®-µ-SD version does not use a proportional counter tube as a detector but instead a Si PIN diode. (SD means Solid State Detector). This high-quality semiconductor detector does not require cooling with liquid nitrogen and still enables a very high energy resolution. The SD design is, therefore, predestined for the analysis of completely unknown samples.
Thus, this instrument is suited for quality control of miniaturized pc-boards, chips or contacts. Measurements are possible on structures that are only a few 10 micrometers wide.
Because of this new X-ray optics, the X-RAY XDVM®-µ-SD is capable of analyzing coating systems on very thin structures for thickness and composition, even in areas where conventional X-ray fluorescence instruments have to pass, due to insufficient radiation intensity.
The WinFTM® V.6 Software allows for the analysis of multi-coating systems with up to 24 individual layers or of alloys with up to 24 different elements .
Please note:
The version XDVM-µ-SD-C is for applications, where a small measuring spot as well as a high x-ray intensity is needed.
The x-ray optics consists of a polycapillary system which is focussing the primary x-ray beam on the measuring spot of the sample.
Contrary to the purely µ-design version, the XDVM®-µ-SD version does not use a proportional counter tube as a detector but instead a Si PIN diode. (SD means Solid State Detector). This high-quality semiconductor detector does not require cooling with liquid nitrogen and still enables a very high energy resolution. The SD design is, therefore, predestined for the analysis of completely unknown samples.
Thus, this instrument is suited for quality control of miniaturized pc-boards, chips or contacts. Measurements are possible on structures that are only a few 10 micrometers wide.
Because of this new X-ray optics, the X-RAY XDVM®-µ-SD is capable of analyzing coating systems on very thin structures for thickness and composition, even in areas where conventional X-ray fluorescence instruments have to pass, due to insufficient radiation intensity.
The WinFTM® V.6 Software allows for the analysis of multi-coating systems with up to 24 individual layers or of alloys with up to 24 different elements .
Please note:
The version XDVM-µ-SD-C is for applications, where a small measuring spot as well as a high x-ray intensity is needed.
The x-ray optics consists of a polycapillary system which is focussing the primary x-ray beam on the measuring spot of the sample.
FISCHERSCOPE® X-RAY 4000
Hardware Features:
The FISCHERSCOPE® X-RAY 4000 measures continuously rolling material strips in a contact-free way. The material range comprises even or punched strips, mainly when the strip material shows a formed or embossed surface.
Coating thickness and material analysis of practically all metallic layer systems can be performed in one run. The well-designed measuring head is flexible and robust. The protection hood can be removed easiliy and is equipped with a double-acting security device. The strip guidance can be set easiliy and quickly. It allows for precise and very quick positioning of the specimen, because of the high-resolution color video camera.
The FISCHERSCOPE® X-RAY 4000 measures continuously rolling material strips in a contact-free way. The material range comprises even or punched strips, mainly when the strip material shows a formed or embossed surface.
Coating thickness and material analysis of practically all metallic layer systems can be performed in one run. The well-designed measuring head is flexible and robust. The protection hood can be removed easiliy and is equipped with a double-acting security device. The strip guidance can be set easiliy and quickly. It allows for precise and very quick positioning of the specimen, because of the high-resolution color video camera.
FISCHERSCOPE X-Ray XAN 150
The XAN® 150 is especially well suited for measuring and analyzing thin coatings, even with very complex compositions or small concentrations.
Typical areas of application are:
Measurement of functional coatings, starting from a few nanometers, in the electronics and semiconductor industries
Trace analysis for consumer protection, e.g. lead content in toys
Analysis of alloys with highest requirements of accuracy in the jewelry and watch industries and in metal refineries
Research in universities and in the industries
Using the fundamental parameter method, coating systems as well as solid and liquid samples can be analyzed standard-free. It is possible to detect up to 24 elements in a range from aluminum (13) to uranium (92) simultaneously. The instrument has an excellent accuracy and long-term stability, which among other things is reflected in a significantly reduced calibration effort.
For high accuracy tasks, calibrations can be performed at any time. Excellent ergonomics, easy operation, fast calculation and data presentation are all features of the instrument.
To create ideal excitation conditions for every measurement, the XAN® 150 features electrically changeable apertures and primary filters. The modern silicon drift detector achieves high accuracy and good detection sensitivity.
Typical areas of application are:
Measurement of functional coatings, starting from a few nanometers, in the electronics and semiconductor industries
Trace analysis for consumer protection, e.g. lead content in toys
Analysis of alloys with highest requirements of accuracy in the jewelry and watch industries and in metal refineries
Research in universities and in the industries
Using the fundamental parameter method, coating systems as well as solid and liquid samples can be analyzed standard-free. It is possible to detect up to 24 elements in a range from aluminum (13) to uranium (92) simultaneously. The instrument has an excellent accuracy and long-term stability, which among other things is reflected in a significantly reduced calibration effort.
For high accuracy tasks, calibrations can be performed at any time. Excellent ergonomics, easy operation, fast calculation and data presentation are all features of the instrument.
To create ideal excitation conditions for every measurement, the XAN® 150 features electrically changeable apertures and primary filters. The modern silicon drift detector achieves high accuracy and good detection sensitivity.
FISCHERSCOPE X-Ray XUV® 773
The XUV® 773 is designed for thin layer measurement and analysis in general. Therefore it is dedicated for research, quality control and optimization of production processes. Typical applications are:
Thin coatings like CIGS, CIS, CdTe
Coatings and analysis in electronic and semiconductor industries
Gold, jewelry and gem stone analysis, without alteration of the sample
Analysis of traces, RoHS, WEEE
Thin coatings like CIGS, CIS, CdTe
Coatings and analysis in electronic and semiconductor industries
Gold, jewelry and gem stone analysis, without alteration of the sample
Analysis of traces, RoHS, WEEE
FISCHERSCOPE® X-RAY XULM
Features
Flexible instrument for measuring coating thickness with multiple uses
Both thin and thick coatings (e.g. 50 nm Au or 100 µm Sn) can be measured equally well through selectable high voltage filter combinations
The micro-focus tube enables small measurement spot sizes at short measurement distances of just 100 µm
High count rates of a few kcps through proportional counter tube
Measuring direction from bottom to top, this allows for quick and easy sample positioning
Large measurement chamber with a cutout (C-slot)
Typical fields of application
Measurement of coatings such as Au/Ni/Cu/PCB or Sn/Cu/PCB in the PC Board industry
Coatings on connectors and contacts in the electronics industry
Decorative coatings Cr/Ni/Cu/ABS
Electroplated coatings such as Zn/Fe, ZnNi/Fe as corrosion protection on mass-produced parts (screws and nuts)
Jewellery and watch industry
Determination of the metal content of electroplating baths
Flexible instrument for measuring coating thickness with multiple uses
Both thin and thick coatings (e.g. 50 nm Au or 100 µm Sn) can be measured equally well through selectable high voltage filter combinations
The micro-focus tube enables small measurement spot sizes at short measurement distances of just 100 µm
High count rates of a few kcps through proportional counter tube
Measuring direction from bottom to top, this allows for quick and easy sample positioning
Large measurement chamber with a cutout (C-slot)
Typical fields of application
Measurement of coatings such as Au/Ni/Cu/PCB or Sn/Cu/PCB in the PC Board industry
Coatings on connectors and contacts in the electronics industry
Decorative coatings Cr/Ni/Cu/ABS
Electroplated coatings such as Zn/Fe, ZnNi/Fe as corrosion protection on mass-produced parts (screws and nuts)
Jewellery and watch industry
Determination of the metal content of electroplating baths
FISCHERSCOPE XAN 220
X-ray fluorescence measuring instrument for fast and non-destructive analysis of gold and silver alloys
Features
Optimized for non-destructive analysis of jewelry, coins and precious metals
Fixed aperture and fixed filter; thus particularly suited for precious metal analysis
With high-resolution silicon drift detector (SDD) also applicable for more complex analyses with many elements
Measuring direction from bottom to top, this allows for quick and easy sample positioning
Typical fields of application
Gold and precious metal analysis in the jewellery and watch industries
Analysis of dental alloys
Features
Optimized for non-destructive analysis of jewelry, coins and precious metals
Fixed aperture and fixed filter; thus particularly suited for precious metal analysis
With high-resolution silicon drift detector (SDD) also applicable for more complex analyses with many elements
Measuring direction from bottom to top, this allows for quick and easy sample positioning
Typical fields of application
Gold and precious metal analysis in the jewellery and watch industries
Analysis of dental alloys
FISCHERSCOPE XAN 315
Cost-effective and compact entry-level X-Ray Fluorescence (XRF) Measuring Instrument for fast and non-destructive Analysis and Coating Thickness Measurement of Gold and Silver Alloys
Features
Lightweight instrument, compact design, low mass (appr. 25 kg, 55 lb) and small footprint
Specialised for the cost-effective XRF analysis of gold alloys
Fixed aperture and fixed filter; thus particularly suited for precious metal analysis
With semiconductor detector also applicable for more complex analyses with many elements
Measuring direction from bottom to top, this allows for quick and easy sample positioning
Typical fields of application are the analysis of
Gold and precious metal analysis in the jewellery and watch industries
Analysis of dental alloys
Yellow and white gold
Platinum and silver
Rhodium
Alloys and coatings
Multi layer coatings
Features
Lightweight instrument, compact design, low mass (appr. 25 kg, 55 lb) and small footprint
Specialised for the cost-effective XRF analysis of gold alloys
Fixed aperture and fixed filter; thus particularly suited for precious metal analysis
With semiconductor detector also applicable for more complex analyses with many elements
Measuring direction from bottom to top, this allows for quick and easy sample positioning
Typical fields of application are the analysis of
Gold and precious metal analysis in the jewellery and watch industries
Analysis of dental alloys
Yellow and white gold
Platinum and silver
Rhodium
Alloys and coatings
Multi layer coatings
FISCHERSCOPE X-RAY XAN 250
Universal high performance X-ray fluorescence (XRF) measuring instrument for fast and non-destructive material analysis and coating thickness measurement
Features
Universal premium instrument with comprehensive measurement capabilities
Aperture (collimator) 4x electrically changeable, Primary filter 6x electrically changeable
With high-resolution silicon drift detector (SDD) also applicable for more complex analyses with many elements
Measuring direction from bottom to top, this allows for quick and easy sample positioning
Typical fields of application
Measurement of functional coatings, starting from a few nanometers, in the electronics and semiconductor industries
Trace analysis for consumer protection, e.g. lead content in toys
Analysis of alloys with highest requirements of accuracy in the jewelry and watch industries and in metal refineries
Research in universities and in the industries
Features
Universal premium instrument with comprehensive measurement capabilities
Aperture (collimator) 4x electrically changeable, Primary filter 6x electrically changeable
With high-resolution silicon drift detector (SDD) also applicable for more complex analyses with many elements
Measuring direction from bottom to top, this allows for quick and easy sample positioning
Typical fields of application
Measurement of functional coatings, starting from a few nanometers, in the electronics and semiconductor industries
Trace analysis for consumer protection, e.g. lead content in toys
Analysis of alloys with highest requirements of accuracy in the jewelry and watch industries and in metal refineries
Research in universities and in the industries
FISCHERSCOPE® X-RAY XDLM
X-ray fluorescence (XRF) measuring instrument for manual or automated coating thickness measurements and analyses on pc-boards, electronics components and mass-produced parts, even on small components
Features
Very universal because equipped with a micro-focus tube, 4-x aperture changer and 3 primary filters
Suitable for smaller structures such as connector contacts or printed circuit boards
Larger measuring distances are possible as well (DCM, stroke 0-80 mm)
Large and spacious measurement chamber with a cutout
(C-slot)
A programmable stage for automated measurements is available
Typical fields of application
Measurement of e.g. thin gold, palladium and nickel coatings in the PC Board industry
Measurement of coated connectors and contacts
Measurement of functional coatings in the electronics and semiconductor industries
Gold, jewellery and watch industries
Features
Very universal because equipped with a micro-focus tube, 4-x aperture changer and 3 primary filters
Suitable for smaller structures such as connector contacts or printed circuit boards
Larger measuring distances are possible as well (DCM, stroke 0-80 mm)
Large and spacious measurement chamber with a cutout
(C-slot)
A programmable stage for automated measurements is available
Typical fields of application
Measurement of e.g. thin gold, palladium and nickel coatings in the PC Board industry
Measurement of coated connectors and contacts
Measurement of functional coatings in the electronics and semiconductor industries
Gold, jewellery and watch industries
